在TMR數(shù)字輸入模塊上，所有關(guān)鍵信號路徑都是100%的三倍，以保證

安全性和最大可用性。每個(gè)通道獨(dú)立調(diào)節(jié)信號并提供

現(xiàn)場和Tricon控制器之間的隔離。3504E型高密度模塊

一個(gè)例外，它沒有通道到通道隔離。

3502E、3503E和3505E型包括自檢功能，可驗(yàn)證

Tricon控制器，用于檢測從正常通電電路到斷開狀態(tài)的轉(zhuǎn)換。因?yàn)?/p>

大多數(shù)安全系統(tǒng)使用斷電跳閘設(shè)置，檢測關(guān)閉狀態(tài)的能力是

重要功能。為了測試接通輸入是否卡住，輸入電路中的開關(guān)閉合至

允許零輸入（Off）被光學(xué)隔離電路讀取。最后一次數(shù)據(jù)讀取是

在測試運(yùn)行時(shí)凍結(jié)在I/O處理器中。

3501E/T 115 VAC/VDC 32 TMR，隔離，非通用

3502E 48 VAC/VDC 32 TMR，常見于8組，具有電路卡在自檢功能。

3503E 24 VAC/VDC 32 TMR，常見于8組，具有電路卡在自檢功能。

3504E 24/48 VDC 64 TMR，普通，高密度，直流耦合，帶電路

卡頓開啟或卡頓關(guān)閉自檢功能。在中配置

TriStation為24或48 VDC。

3505E 24 VDC 32 TMR，普通，低閾值，電路卡在接通或

卡住關(guān)閉自檢功能。

3564 24 VDC 64單個(gè)，普通

每個(gè)數(shù)字輸入模塊都有三個(gè)獨(dú)立的通道，用于處理輸入到

單元在每個(gè)通道上，微處理器掃描每個(gè)輸入點(diǎn)，編譯數(shù)據(jù)，以及

根據(jù)需要將其傳輸?shù)街魈幚砥鳌Ｈ缓筝斎霐?shù)據(jù)在Main進(jìn)行投票

處理器在處理之前確保最高的完整性。

所有數(shù)字輸入模塊都能對每個(gè)通道進(jìn)行完整、持續(xù)的診斷。的失敗

任何通道上的任何診斷都會(huì)激活故障指示燈，進(jìn)而激活機(jī)箱

報(bào)警信號。故障指示燈指向通道故障，而不是模塊故障。該模塊是

保證在出現(xiàn)單一故障時(shí)正常運(yùn)行，并可繼續(xù)運(yùn)行

正確處理某些類型的多重故障。

On TMR Digital Input Modules, all critical signal paths are 100 percent triplicated to guarantee

safety and maximum availability. Each channel conditions signals independently and provides

isolation between the field and the Tricon controller. The model 3504E high-density module is

an exception—it has no channel-to-channel isolation.

Models 3502E, 3503E, and 3505E include a self-test feature which verifies the ability of the

Tricon controller to detect transitions from a normally energized circuit to the Off state. Because

most safety systems use a de-energize-to-trip setting, the ability to detect the Off state is an

important feature. To test for stuck-On inputs, a switch within the input circuitry is closed to

allow a zero input (Off) to be read by the optical isolation circuitry. The last data reading is

frozen in the I/O Processor while the test is running.

3501E/T 115 VAC/VDC 32 TMR, isolated, non-commoned

3502E 48 VAC/VDC 32 TMR, commoned in groups of 8, with a circuit stuck-On selftest feature.

3503E 24 VAC/VDC 32 TMR, commoned in groups of 8, with a circuit stuck-On selftest feature.

3504E 24/48 VDC 64 TMR, commoned, high density, DC-coupled, with a circuit

stuck-On or stuck-Off self-test feature. Configured in

TriStation as 24 or 48 VDC.

3505E 24 VDC 32 TMR, commoned, low threshold, with a circuit stuck-On or

stuck-Off self-test feature.

3564 24 VDC 64 Single, commoned

Each Digital Input Module has three independent channels which process all data input to the

module. On each channel, a microprocessor scans each input point, compiles data, and

transmits it to the Main Processors upon demand. Then input data is voted at the Main

Processors before processing to ensure the highest integrity.

All Digital Input Modules sustain complete, ongoing diagnostics for each channel. Failure of

any diagnostic on any channel activates the Fault indicator which in turn activates the chassis

alarm signal. The Fault indicator points to a channel fault, not a module failure. The module is

guaranteed to operate properly in the presence of a single fault and may continue to operate

properly with certain kinds of multiple faults.